Horseheads, NY, United States of America

Sang-Mook Lee

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Corning Incorporated. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sang-Mook Lee. Retrieved from https://idiyas.com/inventor/sang-mook-lee-9imsescz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations of Sang-Mook Lee in Glass Measurement Technology

Introduction

Sang-Mook Lee is an accomplished inventor based in Horseheads, NY (US). He has made significant contributions to the field of glass measurement technology. His innovative approach has led to the development of a unique method for measuring the thickness of glass articles.

Latest Patents

Sang-Mook Lee holds a patent for a "Method and system for measuring thickness of glass article." This method involves introducing light into a glass article, allowing a portion of the light to be emitted from the edge of the glass. The emitted light is then detected, and an intensity profile is created based on the axial position of the light. By determining the first and second intensity boundaries of this profile, the thickness of the glass layer can be accurately measured.

Career Highlights

Sang-Mook Lee is currently employed at Corning Incorporated, a leading company in glass and ceramics technology. His work at Corning has allowed him to apply his innovative ideas in a practical setting, contributing to advancements in the industry.

Collaborations

Some of his notable coworkers include James Patrick Trice and Chong Pyung An. Their collaboration has fostered an environment of innovation and creativity within the team.

Conclusion

Sang-Mook Lee's contributions to glass measurement technology exemplify the impact of innovation in the field. His patented method showcases the potential for advancements in precision measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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