Zurich, Switzerland

Sandro Kundert

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Wilco Ag. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sandro Kundert. Retrieved from https://idiyas.com/inventor/sandro-kundert

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Sandro Kundert

Introduction

Sandro Kundert is a notable inventor based in Zurich, Switzerland. He has made significant contributions to the field of gas measurement technology. His innovative approach has led to the development of a unique method for measuring gas concentrations.

Latest Patents

Kundert holds a patent for a "Method for measuring a concentration of a gas." This method involves measuring gas concentration in a container with a deformable wall. The gas absorbs electromagnetic radiation in a specific spectral range. The process includes biasing the deformable portion of the wall and transmitting electromagnetic radiation into the biased volume. The concentration of the gas is determined from the radiation received.

Career Highlights

Sandro Kundert is associated with Wilco AG, where he applies his expertise in gas measurement technologies. His work at the company has been instrumental in advancing measurement techniques. Kundert's innovative methods have the potential to enhance various applications in industrial and research settings.

Collaborations

Due to space constraints, details about collaborations will not be included.

Conclusion

Sandro Kundert's contributions to gas measurement technology exemplify the impact of innovative thinking in scientific advancements. His patent reflects a significant step forward in the field, showcasing his dedication to improving measurement methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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