Cachan, France

Sandrine Lévêque-Fort

This inventor holds 1 USPTO granted patent. Top assignee: Centre National De La Recherche Scientifique. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sandrine Lévêque-Fort. Retrieved from https://idiyas.com/inventor/sandrine-lévêque-fort

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Sandrine Lévêque-Fort: Innovator in Dynamic Optical Microscopy

Introduction

Sandrine Lévêque-Fort is a prominent inventor based in Cachan, France. She has made significant contributions to the field of dynamic optical microscopy, particularly through her innovative methods for observing light emissions from samples.

Latest Patents

Lévêque-Fort holds a patent for a method of observation of the emission of light from a sample by dynamic optical microscopy. This method involves observing light emissions in a medium with a specific refractive index, utilizing an observation device that applies filters to the signal. The process allows for the modulation of the signal to produce useful image zones of the sample, highlighting differences related to the modulation.

Career Highlights

She is affiliated with the Centre National de La Recherche Scientifique, where she continues to advance her research and innovations. Her work has garnered attention for its potential applications in various scientific fields.

Collaborations

Lévêque-Fort collaborates with notable colleagues, including Emmanuel Fort and Karla Balaa, contributing to a dynamic research environment.

Conclusion

Sandrine Lévêque-Fort's contributions to dynamic optical microscopy exemplify her innovative spirit and dedication to advancing scientific knowledge. Her work continues to inspire future research in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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