This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Malvern Panalytical B.v.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Sander Weijers: Inventor in X-Ray Diffraction Technology.
Introduction
Sander Weijers is an inventor based in Almelo, Netherlands. His patent work includes technology for X-ray diffraction analysis.
Latest Patents
Weijers is associated with one patent, titled “X-Ray Detector for X-Ray Diffraction Analysis Apparatus.” The invention concerns an X-ray detector designed for use in an apparatus for X-ray diffraction analysis. His listed portfolio includes 1 patent.
Career Highlights
Weijers is associated with Malvern Panalytical B.V., a company working in analytical measurement technologies. His patent reflects his contribution to the development of equipment used in scientific analysis.
Collaborations
Weijers is listed as a coworker of Roelof De Vries. Their shared professional association is connected with Malvern Panalytical B.V.
Conclusion
Sander Weijers’s patent on an X-ray detector highlights his work in technology for X-ray diffraction analysis and his association with Malvern Panalytical B.V.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile