Bengaluru, India

Sandeep Nellyam Kunnath

This inventor holds 1 USPTO granted patent. Top assignee: Tata Consultancy Services Limited. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sandeep Nellyam Kunnath. Retrieved from https://idiyas.com/inventor/sandeep-nellyam-kunnath

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Sandeep Nellyam Kunnath: Innovator in Visual Change Detection

Introduction

Sandeep Nellyam Kunnath is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of scene change detection, particularly through the use of Unmanned Vehicles (UVs). His innovative approach addresses challenges in visual inspection and change detection.

Latest Patents

Sandeep holds a patent for a "Method and system for visual change detection using multi-scale analysis." This patent focuses on improving the clarity of images captured by UVs during inspections. The technology utilizes a multi-scale super pixel technique to generate a change map, allowing for effective detection of changes between captured and reference images.

Career Highlights

Sandeep is currently employed at Tata Consultancy Services Limited, where he applies his expertise in technology and innovation. His work has been instrumental in advancing the capabilities of UVs in various applications.

Collaborations

Sandeep has collaborated with talented coworkers, including Ashley Varghese and Jayavardhana Rama Gubbi Lakshminarasimha. These collaborations have contributed to the development of innovative solutions in their field.

Conclusion

Sandeep Nellyam Kunnath is a pioneering inventor whose work in visual change detection is shaping the future of Unmanned Vehicle technology. His contributions are paving the way for more effective and reliable inspection methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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