Abu Dhabi, United Arab Emirates

Sanaa Kaddoura

This inventor holds 1 USPTO granted patent. Top assignee: Zayed University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sanaa Kaddoura. Retrieved from https://idiyas.com/inventor/sanaa-kaddoura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sanaa Kaddoura: Advancing Automated Course Competency Analysis.

Introduction

Sanaa Kaddoura is an inventor based in Abu Dhabi, United Arab Emirates, and is associated with Zayed University. Her patent work addresses how technology can help align educational courses with the competencies required for jobs.

Latest Patents

Kaddoura is named on 1 patent: “Hybrid Approach for Automated Gap Analysis with Course Competency.” The invention describes a computer-implemented method that generates datasets of job competencies and course competencies, identifies competencies required for a job but missing from a course, and outputs recommended courses for incorporating those competencies. Its approach to identifying competencies can combine rule-based and similarity matching or use a pretrained large language model.

Career Highlights

The patent highlights Kaddoura’s work at the intersection of education, competency analysis, and automated recommendation systems. By identifying gaps between job requirements and course content, the method is designed to support more targeted curriculum development.

Collaborations

Kaddoura is associated with Zayed University. The available information identifies the university connection but does not specify additional collaborators.

Conclusion

Sanaa Kaddoura’s patent presents an automated approach to identifying competency gaps and recommending course improvements, connecting educational content more closely with workplace requirements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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