Samuel V Tidwell

Title: Innovations of Samuel V Tidwell

Introduction

Samuel V Tidwell is a notable inventor based in Norcross, GA (US). He has made significant contributions to the field of particle size analysis, holding 2 patents that showcase his innovative approach to technology.

Latest Patents

Tidwell's latest patents include an X-ray particle size analyzer and a safety interlock for the X-ray particle size analyzer. The X-ray particle size analyzer is designed to take data at specific positions along the sedimentation cell, with each position individually calibrated. This allows for the accurate presentation of data in the form of a particle size distribution curve using interpolation techniques. The design of the sedimentation cell is free from undesirable density gradients, capable of detecting and removing bubbles, and ensures a highly uniform dispersion of the sample prior to sedimentation. Additionally, it includes a safety interlock device that blocks X-ray projection when the cell is being accessed. The safety interlock for the X-ray particle size analyzer shares similar features, emphasizing the importance of safety and accuracy in particle size analysis.

Career Highlights

Samuel V Tidwell is associated with Micromeritics Instrument Corporation, where he has contributed to the development of advanced analytical instruments. His work has significantly impacted the field of particle size analysis, enhancing the accuracy and safety of measurements.

Collaborations

Tidwell has collaborated with notable coworkers such as Jack J Wagner and James P Olivier, contributing to the innovative environment at Micromeritics Instrument Corporation.

Conclusion

Samuel V Tidwell's contributions to the field of particle size analysis through his patents and work at Micromeritics Instrument Corporation highlight his role as a significant inventor. His innovations continue to influence the industry, ensuring safety and precision in analytical measurements.