This inventor holds 2 USPTO granted patents. Top assignee: Beckman Instruments, Inc.. Active years: 1977.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1977
Title: Samuel H. Luitwieler: Innovator in Nuclear Radiation Measurement
Introduction
Samuel H. Luitwieler is a notable inventor based in La Mirada, California. He has made significant contributions to the field of nuclear radiation measurement, holding a total of 2 patents. His work focuses on improving the accuracy and reliability of gamma radiation measurement instruments.
Latest Patents
Luitwieler's latest patents include a gamma counter calibration system and a nuclear radiation measuring method and apparatus with blanking time. The gamma counter calibration system is designed to calibrate gamma radiation measurement instruments across various absolute energy ranges. This innovative method involves adjusting the overall signal gain associated with detected gamma rays and storing parameter settings for future use. The second patent addresses the challenge of excessive background radioactivity in scintillation counters. It provides a method for inhibiting measurements during periods of high background radiation, ensuring more accurate readings.
Career Highlights
Samuel H. Luitwieler has worked at Beckman Instruments, Inc., where he has applied his expertise in developing advanced measurement technologies. His contributions have been instrumental in enhancing the performance of nuclear radiation measurement devices.
Collaborations
Luitwieler has collaborated with Donald L. Horrocks, furthering advancements in the field of nuclear radiation measurement.
Conclusion
Samuel H. Luitwieler's innovative work in nuclear radiation measurement has led to significant advancements in the accuracy and reliability of gamma radiation instruments. His patents reflect a commitment to improving measurement techniques in challenging environments.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
