Vuorentausta, Finland

Sampo Pynnonen

This inventor holds 1 USPTO granted patent. Top assignee: Upm Raflatac Oy. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sampo Pynnonen. Retrieved from https://idiyas.com/inventor/sampo-pynnonen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Sampo Pynnonen: Innovator in Label Laminate Technology

Introduction

Sampo Pynnonen is a notable inventor based in Vuorentausta, Finland. He has made significant contributions to the field of label laminate technology, showcasing his innovative spirit through his patented inventions.

Latest Patents

Pynnonen holds a patent for a "Label laminate and a method and a system for manufacturing a label laminate." This invention pertains to a method for creating a label laminate, which involves forming a water-based adhesive layer on a belt, drying it, and laminating it with material layers to produce the final product. His work emphasizes efficiency and effectiveness in the manufacturing process of label laminates.

Career Highlights

Sampo Pynnonen is associated with UPM Raflatac Oy, a company known for its expertise in label materials. His role at the company has allowed him to focus on innovative solutions in the label industry, contributing to advancements in manufacturing techniques.

Collaborations

Throughout his career, Pynnonen has collaborated with esteemed colleagues such as Risto H Jokinen and Jorma Henttonen. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies in label laminates.

Conclusion

Sampo Pynnonen's contributions to label laminate technology reflect his dedication to innovation and excellence. His patent and work at UPM Raflatac Oy highlight the importance of advancements in manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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