Lempäälä, Finland

Sami Antero Lakka

This inventor holds 2 USPTO granted patents and 2 published patent applications and 1 EPO patent. Top assignees: Menicon Co., Ltd., Menicon., Ltd.. Active years: 2024-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sami Antero Lakka. Retrieved from https://idiyas.com/inventor/sami-antero-lakka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 50.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024-2026

Loading Chart...
Loading Chart...
2 patents (USPTO):Explore Patents

Title: Biography of Inventor Sami Antero Lakka

Introduction: Sami Antero Lakka is a notable inventor based in Lempaala, Finland. He has made significant contributions to the field of technology, particularly in the area of eye-related determination systems.

Latest Patents: Sami holds a patent for a determination system, computing device, determination method, and program. This innovative system includes a computing device that obtains information related to the eye of a target person from various data sources. It makes determinations based on this information, which can include data from sensors in contact lenses, measurement devices, and diagnostic processes.

Career Highlights: Sami has been instrumental in advancing technology related to eye health and diagnostics. His work has implications for improving the accuracy and efficiency of eye-related assessments.

Collaborations: Throughout his career, Sami has collaborated with talented individuals such as Mouad Lamrani and Stephen D Newman. These partnerships have contributed to the development and refinement of his innovative ideas.

Conclusion: Sami Antero Lakka continues to be a driving force in the field of technology, with his inventions paving the way for future advancements in eye health and diagnostics. His dedication to innovation is evident in his work and collaborations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…