Sam Wong

Title: Innovator Spotlight: Sam Wong and His Electron Beam Inspection System

Introduction

Sam Wong, an inventive mind based in San Jose, California, has garnered recognition for his contributions to the fields of particle scanning and inspection systems. With a singular patent to his name, Wong has showcased his ability to innovate within a specialized area, making significant strides in technology.

Latest Patents

Wong's notable patent, titled "Electron Beam Inspection System and Method," encompasses various embodiments of a method and apparatus designed for particle scanning and automatic inspection. This invention directs a particle beam onto the surface of a substrate, enabling detailed scanning of that substrate. The system is equipped with sophisticated detectors that are capable of detecting secondary particles, back-scattered particles, and transmitted particles. Furthermore, the substrate is mounted on an x-y stage, allowing for enhanced movement during scanning, while also subjected to an electric field to accelerate secondary particles. Notably, the system is built to accurately ascertain the substrate's position relative to the charged particle beam and includes optical alignment mechanisms for precise substrate positioning.

Career Highlights

Sam Wong is associated with Kla Instruments Corporation, where he continues to develop innovative technologies that push the boundaries of inspection systems. His patent showcases his dedication to enhancing particle scanning methodologies, which play a critical role in various industrial applications. Wong’s career reflects a commitment to advancing technology in a manner that addresses practical challenges in the field.

Collaborations

Wong has collaborated with esteemed colleagues such as Dan Meisburger and Alan D Brodie. Their collective expertise in engineering and technology has contributed to the development of systems that fulfill complex inspection requirements, further emphasizing the importance of teamwork in innovation.

Conclusion

In summary, Sam Wong is an exemplary inventor whose work with the Electron Beam Inspection System represents a significant milestone in particle scanning technology. His innovative approach and collaboration with skilled professionals reiterate the impact that dedicated inventors have on enhancing industrial capabilities and advancing technology. Wong’s contributions are a testament to the power of innovation in solving real-world problems.