San Jose, CA, United States of America

Sam-Soo Jung

This inventor holds 1 USPTO granted patent. Top assignee: Photon Dynamics, Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sam-Soo Jung. Retrieved from https://idiyas.com/inventor/sam-soo-jung

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Sam-Soo Jung: Innovator in Electrical Circuit Inspection

Introduction

Sam-Soo Jung is a notable inventor based in San Jose, California. He has made significant contributions to the field of electrical engineering, particularly in the inspection of electrical circuits. His innovative approach has led to the development of a unique system that enhances the accuracy and efficiency of circuit inspections.

Latest Patents

Sam-Soo Jung holds a patent for a "System and method for inspection of electrical circuits." This invention includes a calibration subsystem that applies a time-varying voltage to the electrical circuit being inspected. It also senses differences in the electrical state at various locations within the circuit, providing an indication of defect locations. This advancement is crucial for improving the reliability of electrical systems.

Career Highlights

Sam-Soo Jung is currently employed at Photon Dynamics, Inc., where he continues to work on innovative solutions in electrical engineering. His expertise and dedication to his field have made him a valuable asset to the company.

Collaborations

He collaborates with various professionals, including his coworker Raul Albert Martin, to further enhance the development of inspection technologies.

Conclusion

Sam-Soo Jung's contributions to electrical circuit inspection demonstrate his commitment to innovation and excellence in engineering. His work not only advances technology but also sets a standard for future developments in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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