McLean, VA, United States of America

Sam Atticus Wisotzki

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Booz Allen Hamilton Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sam Atticus Wisotzki. Retrieved from https://idiyas.com/inventor/sam-atticus-wisotzki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Sam Atticus Wisotzki: Innovator in Multi-Mode Scanning Systems

Introduction

Sam Atticus Wisotzki is a notable inventor based in McLean, VA (US). He has made significant contributions to the field of sensing technology, particularly through his innovative patent. His work exemplifies the intersection of advanced technology and practical applications.

Latest Patents

Wisotzki holds a patent for a "Multi-mode scanning system using robust communications path." This technique involves controlling multiple sensors to gather sensed data based on commands received from a remote device. The system utilizes a robust communications channel that comprises several communication paths, allowing for efficient data transmission back to the remote device.

Career Highlights

Sam Wisotzki is currently employed at Booz Allen Hamilton Inc., where he applies his expertise in technology and innovation. His role at the company allows him to work on cutting-edge projects that push the boundaries of what is possible in sensing operations.

Collaborations

Throughout his career, Wisotzki has collaborated with talented individuals such as Alan Leon Kolackovsky and John Robert Jackson. These partnerships have fostered an environment of creativity and innovation, leading to advancements in their respective fields.

Conclusion

Sam Atticus Wisotzki is a distinguished inventor whose work in multi-mode scanning systems showcases his commitment to advancing technology. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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