Salik Syed

Title: Salik Syed and Automated Defect Recognition

Introduction

Salik Syed is an inventor based in Long Beach, California, and is associated with Relativity Space, Inc. His patent work addresses automated recognition and evaluation of pore defects in radiographic images.

Latest Patents

Syed is named on 1 patent: “Automated defect recognition and determinations of pore cluster compliance.” The disclosed process obtains a radiographic (RT) image of an article, identifies overlapping image portions, and classifies pixels in those portions using a pore classification model. It then generates a pore map, maps that information onto the article using sensor data, and identifies regions that exceed rejection thresholds established by predefined rules. The rejected regions can then be displayed for review.

Career Highlights

The patent describes an automated approach to detecting and assessing pore clusters in radiographic inspection. By combining image classification, sensor data, and predefined rejection rules, the process can help identify regions that may require further attention.

Collaborations

Syed’s listed coworkers include Viraj Sinha and Bryson Jones. His company affiliation is Relativity Space, Inc.

Conclusion

Salik Syed’s patent focuses on automating pore-defect recognition and compliance assessment, connecting radiographic imaging with mapped inspection results and threshold-based review.