Binyamina, Israel

Sagi Katz

This inventor holds 1 USPTO granted patent. Top assignee: Marvell Semiconductor Israel Ltd.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sagi Katz. Retrieved from https://idiyas.com/inventor/sagi-katz-h361kj3y

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Sagi Katz: Innovator in Model Checking

Introduction

Sagi Katz is a notable inventor based in Binyamina, Israel. He has made significant contributions to the field of model checking, particularly through his innovative patent. His work focuses on the verification of systems, ensuring that they adhere to specified properties.

Latest Patents

Sagi Katz holds a patent titled "Identification of Missing Properties in Model Checking." This patent describes a method for verification that involves providing an implementation model, which defines model states of a target system and model transitions between those states. Additionally, it includes a specification of the target system, outlining the properties that the system is expected to obey. A tableau is created from the specification, defining tableau states with transitions in accordance with the properties. The tableau transitions are then compared to the model transitions to identify any discrepancies.

Career Highlights

Sagi Katz is currently employed at Marvell Semiconductor Israel Ltd., where he continues to apply his expertise in model checking. His work has been instrumental in advancing the verification processes within the company.

Collaborations

Some of Sagi's coworkers include Orna Grumberg and Daniel Geist. Their collaboration contributes to the innovative environment at Marvell Semiconductor Israel Ltd.

Conclusion

Sagi Katz is a prominent figure in the field of model checking, with a focus on ensuring system verification through his patented methods. His contributions continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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