Gyeonggi-do, South Korea

Saeng-Ki Lim

This inventor holds 1 USPTO granted patent. Top assignee: Imt Company, Ltd.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Saeng-Ki Lim. Retrieved from https://idiyas.com/inventor/saeng-ki-lim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Innovations of Saeng-Ki Lim in Dry Cleaning Technology

Introduction

Saeng-Ki Lim is a notable inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of dry cleaning technology, particularly through his innovative patent that addresses the removal of contaminants from workpiece surfaces.

Latest Patents

Saeng-Ki Lim holds a patent for a dry cleaning apparatus and method. This invention is designed to effectively remove contaminants from surfaces using advanced techniques. The apparatus includes a laser cleaning unit that generates a laser-induced shock wave, which is effective for removing inorganic contaminants. Additionally, it features a flash cleaning unit that produces a pulse wave flash, suitable for eliminating organic contaminants.

Career Highlights

Lim is associated with Imt Company, Ltd., where he applies his expertise in developing innovative cleaning solutions. His work has contributed to advancements in the efficiency and effectiveness of dry cleaning processes.

Collaborations

Some of his notable coworkers include Jong Myoung Lee and Sung-Ho Cho, who collaborate with him on various projects within the company.

Conclusion

Saeng-Ki Lim's contributions to dry cleaning technology through his innovative patent demonstrate his commitment to enhancing cleaning methods. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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