Greensboro, NC, United States of America

Saeil Jeon

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Texas A&M University System. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Saeil Jeon. Retrieved from https://idiyas.com/inventor/saeil-jeon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2019

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Saeil Jeon: Inventor in Nanoparticle and Nanofin Formation.

Introduction

Saeil Jeon is an inventor associated with Greensboro, North Carolina, and the Texas A&M University System. His patent work concerns methods for forming nanoparticles and nanofins in situ.

Latest Patents

Jeon is named on 1 patent: “Systems and Methods for In-Situ Formation of Nanoparticles and Nanofins.” The patent describes thermocycling a solution containing one or more of a molten salt, surfactant, or catalyst to form nanoparticles within the solution or on the surfaces of its vessel. It also describes how particle agglomeration can produce nanofins and microchannels, including on surfaces and wafers.

Career Highlights

Jeon’s disclosed invention focuses on controlling nanoparticle formation and using those particles to create nanofins and microchannels. The methods may use a solution in which nanoparticles have already formed to generate nanofins in a vessel, on a wafer, or within the solution.

Collaborations

The patent lists Debjyoti Banerjee and Byeongnam Jo among Jeon’s collaborators. The work is associated with the Texas A&M University System.

Conclusion

Saeil Jeon’s patent highlights an approach to in-situ nanoparticle formation and the creation of nanofins and microchannels, linking materials processing with potential surface and vessel applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…