Rochester Hills, MI, United States of America

Saed M Abuzahrieh

This inventor holds 1 USPTO granted patent. Top assignee: Ford Global Technolgoies, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Saed M Abuzahrieh. Retrieved from https://idiyas.com/inventor/saed-m-abuzahrieh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Saed M. Abuzahrieh and Vehicle Repair Innovation.

Introduction

Saed M. Abuzahrieh is an inventor associated with Rochester Hills, Michigan, and Ford Global Technologies, LLC. His patent work includes a vehicle repair system designed to help guide and monitor interventions when a vehicle experiences a malfunction.

Latest Patents

Abuzahrieh is credited with 1 patent, titled “Vehicle Repair System.” The invention describes a computer system that generates an ordered protocol of proposed vehicle interventions based on a description of a malfunction. It also evaluates data transmitted onboard the vehicle to identify components and determine whether an actual intervention deviated from the protocol. If a deviation is detected, the system generates an output indicating that difference.

Career Highlights

The vehicle repair system reflects an application of computing and vehicle data to repair processes. By comparing proposed interventions with actions taken on the vehicle, the system is designed to make deviations visible during repair.

Collaborations

Abuzahrieh is associated with Ford Global Technologies, LLC. His listed coworkers include Syed Amaar Ahmad and Khalid Nayaz Ahmed.

Conclusion

Saed M. Abuzahrieh’s patented vehicle repair system combines repair protocols with onboard vehicle data to identify and report when an intervention differs from the proposed course of action.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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