Tokyo, Japan

Sadayoshi Hori

This inventor holds 1 USPTO granted patent. Top assignee: Ricoh Company, Ltd.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sadayoshi Hori. Retrieved from https://idiyas.com/inventor/sadayoshi-hori

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Sadayoshi Hori: Product Market Quality Analysis Innovation.

Introduction

Sadayoshi Hori is an inventor based in Tokyo, Japan, associated with Ricoh Company, Ltd. His patent work focuses on analyzing product quality issues reported in the market and supporting efforts to resolve them.

Latest Patents

Hori is credited with 1 patent: “Product market quality information analyzing back up apparatus, product market quality information analyzing back up system and program for product market quality information analyzing back up.” The invention accesses stored maintenance records for products delivered to customers, extracts market-quality information for a specified period and product item, and analyzes the results. It then displays changes in market quality over time. The system is intended to help organizations improve product quality, address problems more quickly, prevent recurrence, and identify potential issues in advance.

Career Highlights

Hori’s documented patent contribution centers on using maintenance records to make product-quality trends easier to analyze and monitor. This approach connects customer-reported product issues with structured analysis that can support quality-improvement efforts.

Collaborations

Hori’s listed coworkers include Yasuhiro Yamaguchi and Hidenori Umeda. His patent is associated with Ricoh Company, Ltd.

Conclusion

Sadayoshi Hori’s patent describes a data-driven approach to tracking product quality in the market and supporting faster, more preventive responses to product issues.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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