Company Filing History:
Years Active: 2004
Title: The Innovative Contributions of Sabbir M Mian
Introduction
Sabbir M Mian is a notable inventor based in Westminster, MD (US). He has made significant contributions to the field of optics, particularly in the measurement of thin films. His work has implications for various applications in science and technology.
Latest Patents
Sabbir M Mian holds a patent for a "Method and apparatus for simultaneous measurement of the refractive index and thickness of thin films." This innovative technique utilizes a beam deflection method to measure the thickness, refractive index, and optical absorption of transparent materials. The method involves measuring beam deflection after transmission through or reflection off a sample at variable incidence angles. The relationship between beam deflection and incident angle is established through Snell's Law, allowing for accurate determination of sample thickness and index of refraction.
Career Highlights
Sabbir M Mian is associated with the Applied Optics Center of Delaware, Inc., where he applies his expertise in optics and measurement techniques. His work has contributed to advancements in the understanding and application of optical materials.
Collaborations
He has collaborated with notable colleagues such as Mohamed Kamel Amara and Noureddine Melikechi, further enhancing the impact of his research and innovations.
Conclusion
Sabbir M Mian's contributions to the field of optics through his innovative patent demonstrate his commitment to advancing technology. His work continues to influence the measurement techniques used in various scientific applications.