Hsinchu, Taiwan

S P Cheng


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2023-2024

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2 patents (USPTO):Explore Patents

Title: S P Cheng: Innovator in Chemical Mechanical Polishing Technology

Introduction

S P Cheng is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of chemical mechanical polishing (CMP) technology. With a total of 2 patents, Cheng's work has advanced the efficiency and effectiveness of CMP processes in semiconductor manufacturing.

Latest Patents

Cheng's latest patents focus on a chemical mechanical polishing apparatus that utilizes a magnetically coupled pad conditioning disk. This innovative CMP apparatus features a polishing pad situated on the top surface of a rotating platen. It includes a wafer carrier designed to hold a substrate and press it against the polishing pad. Additionally, a slurry dispenser is incorporated to dispense slurry over the pad's surface. The pad conditioning unit consists of a conditioning disk and a conditioning head that holds the disk. The conditioning head is equipped with an electromagnet, while the conditioning disk contains a ferromagnetic material portion that is attracted to the electromagnet when energized.

Career Highlights

Cheng is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading organization in the semiconductor industry. His work has been instrumental in enhancing CMP technologies, which are critical for the production of high-performance semiconductor devices.

Collaborations

Cheng has collaborated with several talented individuals in his field, including coworkers Wen-Pin Ho and Ren-Hao Jheng. Their combined expertise has contributed to the successful development of innovative CMP solutions.

Conclusion

S P Cheng's contributions to chemical mechanical polishing technology have positioned him as a key figure in the semiconductor industry. His innovative patents and collaborations continue to influence advancements in this critical area of manufacturing.

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