Morgan Hill, CA, United States of America

Ryszard Radwanski

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Mercury Diagnostics, Inc.. Active years: 1999-2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ryszard Radwanski. Retrieved from https://idiyas.com/inventor/ryszard-radwanski-nzon1pxo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 4.8

ph-index = 2

Forward Citations = 206(Granted Patents)


Company Filing History:


Years Active: 1999-2000

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2 patents (USPTO):Explore Patents

Title: Ryszard Radwanski: Innovator in Diagnostic Technology

Introduction

Ryszard Radwanski is a notable inventor based in Morgan Hill, California. He has made significant contributions to the field of diagnostic technology, holding two patents that showcase his innovative spirit and technical expertise.

Latest Patents

Among his latest inventions are the Analyte Meter and a Test Strip Device. These patents reflect his commitment to advancing medical diagnostics and improving patient care through innovative solutions.

Career Highlights

Ryszard is currently employed at Mercury Diagnostics, Inc., where he continues to develop cutting-edge technologies. His work at this company has positioned him as a key player in the diagnostic industry.

Collaborations

Ryszard has collaborated with talented individuals such as Joel Sterling Douglas and Brent G Duchon. These partnerships have further enhanced his ability to innovate and create impactful solutions in his field.

Conclusion

Ryszard Radwanski's contributions to diagnostic technology through his patents and collaborations highlight his role as a significant inventor in the industry. His work continues to influence advancements in medical diagnostics.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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