Kobe, Japan

Ryousuke Kanamaru

This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignee: Kawasaki Jukogyo Kabushiki Kaisha. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ryousuke Kanamaru. Retrieved from https://idiyas.com/inventor/ryousuke-kanamaru

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 50.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Ryousuke Kanamaru and His Semiconductor-Equipment Inventions.

Introduction

Ryousuke Kanamaru is an inventor associated with Kobe, Japan, and Kawasaki Jukogyo Kabushiki Kaisha. His patent work focuses on substrate handling and monitoring semiconductor production equipment. The provided information lists 2 patents.

Latest Patents

Kanamaru’s listed inventions include “Substrate-conveying robot system and substrate-conveying robot.” The system uses a controller to determine the position of a substrate’s notch or orientation flat from an image captured from below the substrate-handling hand while the substrate is being conveyed.

His other listed invention, “Semiconductor production apparatus system,” combines a substrate-holding hand, an image capturer, and a controller. The controller analyzes captured images to detect anomalies in components of semiconductor production apparatus.

Career Highlights

The available information connects Kanamaru’s patent activity with Kawasaki Jukogyo Kabushiki Kaisha. His listed inventions address robotic substrate conveyance and image-based anomaly detection, both relevant to semiconductor manufacturing equipment.

Collaborations

Shinya Kitano and Tomoya Nagasawa are identified as Kanamaru’s coworkers. The provided information does not specify their roles in the listed inventions.

Conclusion

Ryousuke Kanamaru’s listed patents highlight engineering approaches to substrate positioning and equipment monitoring in semiconductor production.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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