Tokyo, Japan

Ryoto Itsubo

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Nec Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ryoto Itsubo. Retrieved from https://idiyas.com/inventor/ryoto-itsubo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ryoto Itsubo: Optical Fiber Sensing and Breakage Detection

Introduction

Ryoto Itsubo is an inventor based in Tokyo, Japan, associated with NEC Corporation. His patent work concerns optical fiber sensing and detecting damage to supporting wires.

Latest Patents

The provided information lists one patent for Itsubo: “Optical Fiber Sensing System, Optical Fiber Sensing Apparatus, and Breakage Detection Method.” The system sends pulsed light through an optical fiber and receives an optical signal in return. It derives the frequency characteristics of vibrations in the fiber from that signal, then uses those characteristics to determine whether the wire supporting the fiber has broken. The disclosed system includes an optical fiber cable, memory, and a processor configured to carry out these operations.

Career Highlights

Itsubo’s listed patent reflects work on sensing technology that uses vibration analysis to identify supporting-wire breakage. The provided information associates him with NEC Corporation and records 1 patent.

Collaborations

Koyo Mori and Naoto Saeki are identified as Itsubo’s coworkers. The supplied information does not specify their roles or describe particular joint projects.

Conclusion

Ryoto Itsubo’s listed invention applies optical fiber sensing and vibration-frequency analysis to detect supporting-wire breakage, highlighting a focused contribution to sensing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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