Yokohama, Japan

Ryosuke Kaku

This inventor holds 1 USPTO granted patent. Top assignee: Canon Kabushiki Kaisha. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ryosuke Kaku. Retrieved from https://idiyas.com/inventor/ryosuke-kaku

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ryosuke Kaku

Introduction

Ryosuke Kaku is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of optical scanning technology. His work is characterized by a focus on enhancing system reliability and compactness in design.

Latest Patents

Ryosuke Kaku holds a patent for an optical beam scanner with circuit board mounted elements. This innovative optical scanning apparatus includes a light source unit, a first circuit board equipped with the light source unit, and a deflector that deflects the light beam from the light source unit. The design allows for mechanical adjustment of the positions of the first and second circuit boards, resulting in a compact optical beam scanner that offers sufficient bending strength and precision.

Career Highlights

Kaku is associated with Canon Kabushiki Kaisha, a leading company in imaging and optical products. His work at Canon has allowed him to push the boundaries of optical technology and contribute to advancements in the field.

Collaborations

Ryosuke Kaku has collaborated with talented coworkers such as Yoshinori Sugiura and Shin Mogi. Their combined expertise has fostered innovation and development in their projects.

Conclusion

Ryosuke Kaku's contributions to optical scanning technology exemplify the spirit of innovation. His patent reflects a commitment to enhancing system reliability and compact design in optical devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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