Tokyo, Japan

Ryoma Iio

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Nec Corporation. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ryoma Iio. Retrieved from https://idiyas.com/inventor/ryoma-iio

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Ryoma Iio

Introduction

Ryoma Iio is a prominent inventor based in Tokyo, Japan. He is known for his contributions to the field of image recognition technology. With a focus on enhancing the efficiency of image processing, Iio has made significant strides in this innovative domain.

Latest Patents

Ryoma Iio holds a patent for an image recognition system, image recognition method, and storage medium. This invention provides an image recognition system that can easily perform image recognition on the side face of an item. The system includes a placement stage for positioning an item below an image capture device, a support structure to hold the item at a specific angle, and an image recognition apparatus that identifies the item through image recognition.

Career Highlights

Iio is currently employed at NEC Corporation, where he continues to develop cutting-edge technologies. His work at NEC has allowed him to collaborate with other talented professionals in the field, further enhancing his contributions to innovation.

Collaborations

Some of Ryoma Iio's notable coworkers include Kota Iwamoto and Hideo Yokoi. Their collaborative efforts have played a crucial role in advancing the projects they work on together.

Conclusion

Ryoma Iio's innovative spirit and dedication to image recognition technology have positioned him as a key figure in his field. His patent and ongoing work at NEC Corporation reflect his commitment to pushing the boundaries of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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