Tokyo, Japan

Ryohei Adachi

This inventor holds 1 USPTO granted patent. Top assignee: Sony Corporation. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ryohei Adachi. Retrieved from https://idiyas.com/inventor/ryohei-adachi-cex6h1te

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Ryohei Adachi - Innovating Electric Current Measurement

Introduction

Ryohei Adachi, an inventive mind based in Tokyo, Japan, has made a significant impact in the field of electrical engineering. With a keen focus on developing advanced measurement instruments, he holds a notable patent that showcases his contributions to technology.

Latest Patents

Adachi's most recent patent is an electric current measuring instrument. This innovation is designed to enhance the accuracy and efficiency of current measurement, playing a vital role in various applications within electrical systems.

Career Highlights

Ryohei Adachi works at Sony Corporation, a globally recognized leader in technology and electronics. His role at a prominent company allows him to harness resources and expertise, furthering his work and innovations in measurement technologies.

Collaborations

Throughout his career, Adachi has had the opportunity to collaborate with talented individuals such as Noriyoshi Iwasaki and Takashi Shirai. These partnerships foster a creative environment that has likely contributed to the success of his innovations.

Conclusion

Ryohei Adachi's dedication to the advancement of electric current measurement instruments marks him as a noteworthy inventor in today's technological landscape. Through his work at Sony Corporation and his collaborative efforts, he continues to push the boundaries of innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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