Tokyo, Japan

Ryo Tanabe

This inventor holds 1 USPTO granted patent and 2 published patent applications and 1 EPO patent. Top assignees: The University of Tokyo, Yamaguchi University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ryo Tanabe. Retrieved from https://idiyas.com/inventor/ryo-tanabe-blttgg2u

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ryo Tanabe: Innovator in Abnormality Detection and Glioma Research

Introduction: Ryo Tanabe is an accomplished inventor based in Tokyo, Japan. He is currently employed at Hitachi, Ltd., where he contributes to advancements in technology and healthcare. Despite having no granted patents to his name, Tanabe is actively involved in innovative research and development.

Latest Patent Applications: Ryo Tanabe has filed several notable patent applications. One of his latest applications is for an "Abnormality Detection System and Abnormality Detection Method." This system aims to provide stable abnormality detection in target machines by utilizing a communication unit to acquire data from sensors, an arithmetic unit for processing, and a memory unit. Another significant application is for a "Therapeutic and Prophylactic Agent for Glioma," which includes a novel agent for treating or preventing glioma, along with markers for malignancy and prognosis of brain tumors. These applications highlight Tanabe's commitment to addressing critical challenges in technology and medicine.

Conclusion: Ryo Tanabe is a dedicated inventor whose work focuses on improving detection systems and developing treatments for serious health conditions. His contributions, although not yet reflected in granted patents, demonstrate his potential impact in the fields of technology and healthcare.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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