Colorado Springs, CO, United States of America

Ryan Luke Alejo

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: 3D Systems, Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ryan Luke Alejo. Retrieved from https://idiyas.com/inventor/ryan-luke-alejo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Ryan Luke Alejo and Precision in Automated Manufacturing

Introduction

Ryan Luke Alejo is an inventor associated with Colorado Springs, Colorado, and 3D Systems, Inc. His patent work addresses positional alignment in automated manufacturing systems that combine robotics and additive manufacturing.

Latest Patents

Alejo is credited with 1 patent: “Method and Apparatus for Positional Reference in an Automated Manufacturing System.” The invention describes methods and devices for achieving precise, multidimensional alignment among diverse tools working together to construct a solid object. Its embodiments include an automatically deployed contact-sensing probe and a tool-center-point sensor that detects contact along multiple axes. At least one method uses both sensing devices together.

Career Highlights

Alejo’s disclosed invention focuses on improving positional reference in collaborative robotic manufacturing. The approach is designed to help coordinate different tools within an automated system that includes additive manufacturing capabilities.

Collaborations

Alejo’s listed coworkers include William D. Macy and Nathan D. Eversole. His company affiliation is 3D Systems, Inc.

Conclusion

Ryan Luke Alejo’s patent highlights a practical approach to precise tool alignment, supporting coordinated operations in automated robotic and additive manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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