Waltham, NJ, United States of America

Ryan Francis Bedell

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Embecta Corp.. Active years: 2023-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ryan Francis Bedell. Retrieved from https://idiyas.com/inventor/ryan-francis-bedell-4w0yoff1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2023-2024

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3 patents (USPTO):Explore Patents

Title: The Innovations of Ryan Francis Bedell

Introduction

Ryan Francis Bedell is an accomplished inventor based in Waltham, NJ (US). He has made significant contributions to the field of integrated disease management systems. With a total of 3 patents to his name, Bedell continues to push the boundaries of innovation.

Latest Patents

One of his latest patents is a display screen or portion thereof with a graphical user interface for an integrated disease management system. This invention showcases his commitment to improving healthcare technology and enhancing user experience.

Career Highlights

Ryan currently works at Embecta Corp., where he applies his expertise in developing innovative solutions. His work has been instrumental in advancing the company's mission to provide effective healthcare solutions.

Collaborations

Ryan has collaborated with talented individuals such as Joshua Daniel Coyle and Danielle Victoria Butler. These partnerships have fostered a creative environment that encourages innovation and problem-solving.

Conclusion

Ryan Francis Bedell is a notable inventor whose work in integrated disease management systems exemplifies his dedication to innovation. His contributions continue to impact the healthcare industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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