San Jose, CA, United States of America

Ruxi Zhang

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Omnissa, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ruxi Zhang. Retrieved from https://idiyas.com/inventor/ruxi-zhang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ruxi Zhang and Enterprise IT Troubleshooting

Introduction

Ruxi Zhang is an inventor based in San Jose, California. Her patent work addresses ways to troubleshoot enterprise information technology problems through root cause analysis.

Latest Patents

Zhang is associated with one patent, titled “Systems and Methods for Performing a Root Cause Analysis Utilizing Parameters Including Device Context Features to Troubleshoot Enterprise Information Technology Problems.” The invention describes a root cause analysis service that configures analysis parameters, including selected device context features from client devices. The service identifies a target issue affecting those devices and analyzes it to generate root cause candidate patterns for presentation through an interface. Zhang’s record lists 1 patent.

Career Highlights

Zhang is associated with Omnissa, LLC. Her patent reflects work on applying device context information to the diagnosis of enterprise IT issues.

Collaborations

The provided information names Hayden Davis and Kannan Parthasarathy as Zhang’s coworkers. It does not specify their roles in the patent or describe their contributions.

Conclusion

Ruxi Zhang’s patent focuses on using device context features to help identify potential causes of enterprise IT problems, highlighting a practical application of root cause analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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