Stillwater, MN, United States of America

Ruth A May

This inventor holds 1 USPTO granted patent. Top assignee: Honeywell G.m.b.h.. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ruth A May. Retrieved from https://idiyas.com/inventor/ruth-a-may

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Ruth A. May: Innovator in Laser Technology

Introduction

Ruth A. May is a distinguished inventor based in Stillwater, MN (US). She has made significant contributions to the field of laser technology, particularly with her innovative patent that enhances laser intensity monitoring.

Latest Patents

Ruth A. May holds a patent for a "Laser intensity monitoring apparatus with metallic thin film mask." This invention relates to a laser intensity monitor that utilizes a black chrome metallic, non-light transmissive mask deposited on an optically transparent glass or sapphire window. The mask features an aperture that allows only the TEM.sub.00 mode of a counter-rotating laser beam to pass through, striking a photodetector. This advancement is crucial for precise laser intensity measurements.

Career Highlights

Ruth has been associated with Honeywell GmbH, where she has applied her expertise in laser technology. Her work has contributed to the development of advanced monitoring systems that are essential in various applications.

Collaborations

Ruth has collaborated with notable colleagues, including Timothy A. Beckwith and Peter J. Kinsella. Their combined efforts have fostered innovation and progress in their respective fields.

Conclusion

Ruth A. May's contributions to laser technology exemplify her dedication to innovation and excellence. Her patent reflects her commitment to advancing the capabilities of laser monitoring systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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