This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Chang'an University. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Ruru Hao and Critical-Scenario Generation for Autonomous Driving
Introduction
Ruru Hao is an inventor based in Xi’an, China, whose patent work addresses the testing and verification of autonomous-driving systems. Her invention describes a method for generating critical driving scenarios that can help evaluate system performance and safety in complex, high-risk conditions.
Latest Patents
Hao is associated with 1 patent: “Method, System, Apparatus, and Medium for Generating Critical Scenarios in Autonomous Driving Tests.” The invention begins by generating an initial scenario using a lane-coordinate system. It then constructs a one-way, single-lane car-following scenario with an autonomous vehicle controlled by an intelligent driving model (IDM) and an agent vehicle. It also constructs a one-way, dual-lane cut-in scenario featuring an IDM-controlled autonomous vehicle and an intelligent-agent vehicle. The method uses these scenarios to generate critical cases for autonomous-vehicle testing, aiming to make scenario generation more efficient and accurate and to accelerate testing and safety verification.
Career Highlights
Hao is associated with Chang’an University. Her patent focuses on a practical challenge in autonomous-driving development: creating demanding test scenarios that can help assess how vehicles respond to potentially hazardous situations.
Collaborations
The supplied information lists Zhou Zhou and Difei Zhang as Hao’s coworkers. Their specific roles in the patent or related work were not provided.
Conclusion
Ruru Hao’s patent presents a structured approach to generating car-following and cut-in scenarios for autonomous-driving tests, supporting the evaluation of vehicle performance and safety.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile