Bengaluru, India

Rupak D Das

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Rockwell Automation Technologies Incorporated. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rupak D Das. Retrieved from https://idiyas.com/inventor/rupak-d-das

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Rupak D. Das and Industrial Knowledge Graphs.

Introduction

Rupak D. Das is an inventor based in Bengaluru, India. His patent work concerns using industrial data to build knowledge graphs that can help identify events and present potential remedies.

Latest Patents

The provided information lists one patent associated with Das: “Systems and Methods for Generating a Knowledge Graph Based on Industrial Data.” The invention describes a system that receives data collected during an industrial automation process and applies an asset model to contextualize that data. It then determines event data, generates a knowledge graph, identifies an event, and presents possible remedies through a graphical user interface. The listed patent count is 1 patent.

Career Highlights

Das is associated with Rockwell Automation Technologies Incorporated. His patent reflects an application of knowledge graphs and contextualized industrial data to support event identification and remedy recommendations in automation systems.

Collaborations

The provided information names Sudheeshechandran Narayanan and Ganesh H. Iyer as coworkers. Their inclusion indicates professional connections, but no specific roles in the patent are stated.

Conclusion

Rupak D. Das’s listed invention applies knowledge graphs to industrial automation data, connecting contextualized information with event detection and potential remedies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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