Nagoya, Japan

Ruowei Gu

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2004.


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 14(Granted Patents)


Company Filing History:

goldMedal1 out of 834,453 
Other
 patents

Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Ruowei Gu - Innovator in Three-Dimensional Shape Measurement

Introduction

Ruowei Gu is a notable inventor based in Nagoya, Japan. He has made significant contributions to the field of three-dimensional shape measurement. His innovative approach has led to the development of a method that enhances measurement precision.

Latest Patents

Ruowei Gu holds a patent for a three-dimensional shape measuring method. This method allows for the precise measurement of three-dimensional shapes by projecting grid patterns with varying periods and directions onto objects. The use of different colors for each grid enhances the accuracy of the measurement process. The method involves imaging the deformed grid patterns, separating them by color, and detecting the phases of each grid component to obtain measurement values. Additionally, the method captures color information of the objects using white light.

Career Highlights

Throughout his career, Ruowei Gu has focused on advancing measurement technologies. His work has been recognized for its innovative approach and practical applications in various industries. He continues to contribute to the field through his research and development efforts.

Collaborations

Ruowei Gu has collaborated with notable colleagues, including Mitsuo Takeda and Teruaki Yogo. These collaborations have further enriched his work and expanded the impact of his inventions.

Conclusion

Ruowei Gu's contributions to three-dimensional shape measurement exemplify the spirit of innovation. His patented method showcases the potential for improved precision in measurement technologies. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
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