SANTA CLARA, CA, United States of America

Runmin Wang

This inventor holds 1 USPTO granted patent. Top assignee: Pure Storage, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Runmin Wang. Retrieved from https://idiyas.com/inventor/runmin-wang-mzeuvvqr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Runmin Wang

Introduction

Runmin Wang is a notable inventor based in Santa Clara, California. He has made significant contributions to the field of data recovery, showcasing his expertise through his innovative patent. His work focuses on enhancing the reliability of data storage systems, which is crucial in today's digital age.

Latest Patents

Runmin Wang holds a patent titled "Recovering corrupted data through speculative bitflip and cross-validation." This patent outlines a method for recovering corrupted data by altering a first data portion stored in a storage device. The process involves calculating a hash value using the altered data, comparing it to a stored hash value, and determining if the alteration corrects the error. This innovative approach addresses a common issue in data integrity and storage.

Career Highlights

Runmin Wang is currently employed at Pure Storage, Inc., a company renowned for its cutting-edge data storage solutions. His role at Pure Storage allows him to apply his inventive skills in a practical setting, contributing to the development of advanced technologies that improve data management and recovery.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Runmin Wang's contributions to data recovery technology exemplify the importance of innovation in the tech industry. His patent reflects a deep understanding of data integrity challenges and offers a promising solution for the future.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…