Company Filing History:
Years Active: 2025
Title: Rujin Han: Innovator in High-Resolution Phase Detection Technology
Introduction
Rujin Han is a prominent inventor based in Beijing, China. He has made significant contributions to the field of phase detection technology, particularly through his innovative patent that addresses key challenges in measurement accuracy.
Latest Patents
Rujin Han holds a patent for a "High-resolution phase detection method and system based on plane grating laser interferometer." This method utilizes a dual-frequency interferometer to measure displacement accurately. The measurement signal processing involves both an integral part and a decimal portion. A phase equation set is constructed based on the measurement optical path principle of a heterodyne plane grating laser interferometer. Furthermore, a non-linear equation set is established to solve for instantaneous phase, interval phase, and signal amplitude using the least squares method. This innovative approach resolves issues found in traditional time measurement-based phase detection technologies, such as low measurement accuracy and limitations in small measuring range measurements. The method is applicable to precision manufacturing equipment and lithography machines.
Career Highlights
Rujin Han is affiliated with Tsinghua University, where he continues to advance research in his field. His work has garnered attention for its practical applications and contributions to technology.
Collaborations
Rujin has collaborated with notable colleagues, including Yu Zhu and Jinchun Hu, who have contributed to his research endeavors.
Conclusion
Rujin Han's innovative work in high-resolution phase detection technology exemplifies the impact of research and development in precision measurement. His contributions are paving the way for advancements in various technological applications.