Hsinchu, Taiwan

Ruei-Pei Chen

This inventor holds 1 USPTO granted patent. Top assignee: Auo Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ruei-Pei Chen. Retrieved from https://idiyas.com/inventor/ruei-pei-chen-lknmxc0k

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ruei-Pei Chen: Inventor in Sensing Technology.

Introduction

Ruei-Pei Chen is an inventor based in Hsinchu, Taiwan. His patent work includes a sensing device that integrates switching and photoelectric sensing components.

Latest Patents

Chen is associated with 1 patent: “Sensing Device and Fabricating Method of the Same.” The invention describes a substrate carrying a switching element and a sensing element. The sensing element includes a lower electrode connected to the switching element’s source electrode, a photoelectric conversion layer, and an upper electrode. A common electrode connects to the upper electrode and is formed in the same film layer as the source electrode. The patent also describes a method for fabricating the sensing device.

Career Highlights

Chen is associated with AUO Corporation, a company involved in display and related technologies. His patent reflects work on device structures and manufacturing methods for sensing applications.

Collaborations

Chen’s listed coworkers include Chia-Ming Chang and Chia-Hsiu Tsai. Their names are provided as collaborators, though the available information does not specify their roles in the patent.

Conclusion

Ruei-Pei Chen’s patent documents a sensing-device design that combines photoelectric conversion with a switching element and outlines a method for manufacturing the device.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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