Marloffstein, Germany

Rudolf Berger

This inventor holds 1 USPTO granted patent. Top assignee: Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.v.. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rudolf Berger. Retrieved from https://idiyas.com/inventor/rudolf-berger-zaa3bwcd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 20(Granted Patents)


Company Filing History:


Years Active: 1994

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Rudolf Berger: Innovator in Ellipsometry

Introduction

Rudolf Berger is a notable inventor based in Marloffstein, Germany. He has made significant contributions to the field of optics, particularly through his invention of an ellipsometer. His work is recognized for its impact on various scientific and industrial applications.

Latest Patents

Rudolf Berger holds a patent for an ellipsometer, which is a device used to measure the change in polarization as light reflects or transmits through a material. This invention is crucial for understanding the optical properties of thin films and surfaces.

Career Highlights

Berger is affiliated with the Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., a leading organization in applied research in Europe. His role at this prestigious institution has allowed him to engage in cutting-edge research and development.

Collaborations

Throughout his career, Rudolf has collaborated with esteemed colleagues such as Heiner Ryssel and Claus Schneider. These partnerships have fostered innovation and have contributed to advancements in their respective fields.

Conclusion

Rudolf Berger's contributions to the field of ellipsometry exemplify the importance of innovation in scientific research. His work continues to influence the development of optical technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…