This inventor holds 1 USPTO granted patent. Top assignee: USA as Represented by Secretary of the Navy. Active years: 1996.
Company Filing History:
Years Active: 1996
Title: Roy Schiff - Innovator in Reflectometry
Introduction
Roy Schiff is a notable inventor based in McLean, VA (US). He has made significant contributions to the field of reflectometry, particularly with his innovative patent that enhances the measurement of reflectance in various samples.
Latest Patents
Roy Schiff holds a patent for a "Reflectometer employing an integrating sphere and lens-mirror." This reflectometer is designed to project light of a predetermined wavelength into an integrating sphere containing a sample whose reflectance is to be measured. As the projected light strikes the sample, rays are reflected back to the walls of the integrating sphere. Some of these rays enter the field-of-view of a concentrator, where they are focused onto a detector element. This setup allows for the accurate determination of the sample's reflectance. A control means is utilized to manage the wavelength of the projected light through a spectrophotometer, enabling precise calculations of reflectance.
Career Highlights
Roy Schiff is currently associated with the United States Navy, where he contributes his expertise in reflectometry. His work has been instrumental in advancing the technology used for measuring reflectance, which has applications in various scientific and industrial fields.
Collaborations
Throughout his career, Roy has collaborated with notable colleagues, including Keith A Snail and David B Chenault. These partnerships have fostered innovation and have contributed to the successful development of his patented technologies.
Conclusion
Roy Schiff's contributions to reflectometry through his innovative patent demonstrate his commitment to advancing measurement technologies. His work continues to impact the field positively, showcasing the importance of innovation in scientific research.