Shanghai, China

Roy Liu

This inventor holds 1 USPTO granted patent. Top assignee: Mettler-Toledo Ag. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Roy Liu. Retrieved from https://idiyas.com/inventor/roy-liu-5e3mwxcy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: The Innovations of Roy Liu

Introduction

Roy Liu is an accomplished inventor based in Shanghai, China. He has made significant contributions to the field of analytical measuring instruments. With a focus on precision and accuracy, his work has garnered attention in the industry.

Latest Patents

Roy Liu holds a patent for an analytical measuring instrument. This innovation showcases his expertise and commitment to advancing measurement technology. His patent is a testament to his ability to create solutions that meet the needs of various industries.

Career Highlights

Roy Liu is currently employed at Mettler-Toledo AG, a leading company in precision instruments. His role at Mettler-Toledo AG allows him to further develop his skills and contribute to cutting-edge technology. His work has positioned him as a valuable asset in the field of analytical measurement.

Collaborations

Throughout his career, Roy has collaborated with notable colleagues, including Patrick Ammon and Yves Marmier. These partnerships have enabled him to enhance his projects and share innovative ideas.

Conclusion

Roy Liu's contributions to the field of analytical measuring instruments highlight his innovative spirit and dedication to excellence. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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