Roy Koret

Title: Roy Koret: Innovator in Critical Dimension Measurement

Introduction

Roy Koret is a notable inventor based in Rehovot, Israel. He has made significant contributions to the field of optical measurement and machine learning. His innovative approach has led to the development of a unique patent that enhances the accuracy of critical dimension measurements.

Latest Patents

Roy Koret holds a patent titled "Measuring local CD uniformity using scatterometry and machine learning." This patent describes a method, system, and non-transitory computer-readable medium for measuring the local critical dimension uniformity of an array of two-dimensional structural elements. The method involves obtaining an acquired optical spectrometry spectrum of the array, feeding it to a trained machine learning process, and outputting the average critical dimension and local critical dimension uniformity of the array.

Career Highlights

Throughout his career, Roy has worked with prominent companies such as Nova Corporation and IBM. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking advancements in measurement technologies.

Collaborations

Roy has collaborated with talented individuals in his field, including Dexin Kong and Daniel Schmidt. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Roy Koret's work in measuring local critical dimension uniformity through advanced methods showcases his expertise and dedication to innovation. His contributions continue to influence the field of optical measurement and machine learning.