Neundorf, Germany

Ronny Scherf

This inventor holds 1 USPTO granted patent. Top assignee: Honeywell International Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ronny Scherf. Retrieved from https://idiyas.com/inventor/ronny-scherf-yf205na0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ronny Scherf and Runtime Optimization for Facility Maintenance

Introduction

Ronny Scherf is an inventor associated with Neundorf, Germany, and Honeywell International Inc. His patent work addresses ways to improve how facility data models are modified and used for operational monitoring.

Latest Patents

Scherf is associated with 1 patent, titled “Runtime Optimizations to Data Models for Facility Maintenance Operations.” The invention describes a process for handling user requests to update or add asset data in a facility’s data model. It identifies the request category, generates a corresponding query list, and applies the user’s input to modify the model. The updated model can then run with the modified asset data to support dynamic facility monitoring, including the use of asset-related key performance indicators.

Career Highlights

Scherf’s listed patent reflects work on data-model management for facility maintenance operations. The approach is designed to make runtime updates to facility asset information more structured and responsive to user needs. He is associated with Honeywell International Inc.

Collaborations

Scherf’s listed coworkers include Jayalaxmi Telang and Manu Taranath. Their names are provided as professional associations, though specific roles or contributions to the patent are not stated.

Conclusion

Ronny Scherf’s patent focuses on streamlining user-driven updates to facility data models so that modified asset information can support dynamic monitoring.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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