Shanghai, China

Ronghui Chen

This inventor holds 1 USPTO granted patent. Top assignee: Montage Technology Co., Ltd.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ronghui Chen. Retrieved from https://idiyas.com/inventor/ronghui-chen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Ronghui Chen: Innovator in Automatic Test Equipment Calibration

Introduction

Ronghui Chen is a notable inventor based in Shanghai, China. He has made significant contributions to the field of automatic test equipment (ATE) through his innovative methods. His work focuses on enhancing the accuracy and efficiency of testing processes in electronic devices.

Latest Patents

Ronghui Chen holds a patent titled "Method for calibrating channel delay skew of automatic test equipment." This invention relates to a method for calibrating a channel delay skew of ATE. The method involves providing multiple calibration reference devices, each with a predetermined path delay value. It includes coupling pins of the calibration reference devices, testing them to obtain delay measurements, and calculating based on these measurements. This patent showcases his expertise in improving testing methodologies.

Career Highlights

Ronghui Chen is currently employed at Montage Technology Co., Ltd. His role involves working on advanced technologies that enhance the performance of automatic test equipment. His contributions have been instrumental in the development of more reliable testing solutions in the electronics industry.

Collaborations

Ronghui has collaborated with notable colleagues, including Meng Mei and Dongming Lou. Their teamwork has fostered innovation and has led to advancements in their respective fields.

Conclusion

Ronghui Chen's work in the calibration of automatic test equipment represents a significant advancement in the industry. His innovative methods and collaborative efforts continue to drive progress in electronic testing technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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