Sarasota, FL, United States of America

Rong Wang

This inventor holds 1 USPTO granted patent. Top assignee: World Precision Instruments, Inc.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rong Wang. Retrieved from https://idiyas.com/inventor/rong-wang-xlr1zimo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Rong Wang - Innovator in Optical Measurement Technology

Introduction

Rong Wang is a notable inventor based in Sarasota, FL (US). He has made significant contributions to the field of optical measurement technology. His innovative approach has led to the development of a unique method for analyzing very small fluid samples.

Latest Patents

Rong Wang holds a patent for a "Method and apparatus for optical measurement of very small fluid samples." This invention allows for the repetitive collection and analysis of fluid samples of very small but precisely equal volume. The collection cells fill spontaneously, and the analysis is performed with the sample in the cell, enhancing the efficiency of fluid measurement.

Career Highlights

Rong Wang is currently employed at World Precision Instruments, Inc., where he continues to advance his research and development efforts. His work focuses on improving measurement techniques that are crucial for various scientific applications.

Collaborations

Rong Wang collaborates with Harry Fein, a fellow professional in the field. Their combined expertise contributes to the innovative projects at World Precision Instruments, Inc.

Conclusion

Rong Wang's contributions to optical measurement technology exemplify the impact of innovation in scientific research. His patent and ongoing work at World Precision Instruments, Inc. highlight his commitment to advancing measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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