Freeport, NY, United States of America

Ronald J Juels

This inventor holds 1 USPTO granted patent. Top assignee: USA as Represented by Secretary of the Navy. Active years: 1978.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1978

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1 patent (USPTO):Explore Patents

Title: Ronald J Juels: Innovator in Contour Mapping Technology

Introduction

Ronald J Juels is a notable inventor based in Freeport, NY (US), recognized for his contributions to contour mapping technology. He has developed a unique system that addresses the challenges posed by the heave or vertical displacement of ships due to wave and swell effects. His innovative approach enhances the accuracy of depth or bottom contour measurements in bodies of water.

Latest Patents

Juels holds a patent for a device known as the Heave Meter. This contour mapping system incorporates compensation for the vertical displacement of a ship, ensuring that errors caused by wave and swell effects are corrected. The system utilizes vertical acceleration measured by a gravity meter accelerometer, which is filtered through a series of cascaded filters to yield the ship's vertical displacement due solely to heave.

Career Highlights

Throughout his career, Ronald J Juels has made significant strides in the field of marine technology. He is currently represented by the Secretary of the Navy in the USA, showcasing his involvement in important governmental projects. His work has contributed to advancements in maritime navigation and safety.

Collaborations

Juels has collaborated with esteemed colleagues, including Norman D Melling and John J De Matteo. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

In summary, Ronald J Juels is a distinguished inventor whose work in contour mapping technology has made a lasting impact on maritime navigation. His Heave Meter patent exemplifies his commitment to enhancing the accuracy of underwater measurements.

Profile summary based on public USPTO records.
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