Dayton, OH, United States of America

Ronald E Mack

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent and 1 EPO patent. Top assignee: Gleason Metrology Systems Corporation. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ronald E Mack. Retrieved from https://idiyas.com/inventor/ronald-e-mack

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


 

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ronald E. Mack

Introduction

Ronald E. Mack is an accomplished inventor based in Dayton, OH. He holds a patent that showcases his expertise in the field of measurement technology. His innovative approach has contributed significantly to the efficiency and accuracy of workpiece inspection.

Latest Patents

Ronald E. Mack is credited with a patent titled "Measurement of toothed articles utilizing multiple sensors." This invention involves a method and machine that employs both tactile and non-contact sensors for workpiece inspection and measurement. The technology results in significant cycle time savings while maintaining high accuracy.

Career Highlights

Mack is associated with Gleason Metrology Systems Corporation, where he applies his skills and knowledge to advance measurement technologies. His work has been instrumental in developing solutions that enhance operational efficiency in various industrial applications.

Collaborations

Ronald has collaborated with talented individuals such as Parag Prakash Wagaj and Ethan James Shepherd. Their combined efforts have fostered innovation and contributed to the success of their projects.

Conclusion

In summary, Ronald E. Mack is a notable inventor whose contributions to measurement technology have made a lasting impact. His patent reflects his commitment to innovation and efficiency in industrial processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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