Tel Aviv, Israel

Ron E Dar Ziv

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Microsoft Technology Licensing, LLC. Active years: 2011.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Ron E Dar Ziv: Innovator in Root Cause Problem Identification

Introduction

Ron E Dar Ziv is a notable inventor based in Tel Aviv, Israel. He has made significant contributions to the field of technology, particularly in the area of process failure analysis. His innovative approach to identifying root causes of problems has garnered attention in the industry.

Latest Patents

Ron E Dar Ziv holds a patent for "Root cause problem identification through event correlation." This patent focuses on correlating activity events to identify the root cause of a process failure. The method involves receiving activity event data from a process executing on a computing device. Each activity event is associated with a correlation identifier, a resolution status, and an occurrence time value. The events are grouped based on their correlation identifiers, allowing for the identification of failure events. Ultimately, one activity event is selected as the root cause based on occurrence time values, providing valuable insights to users.

Career Highlights

Ron E Dar Ziv is currently associated with Microsoft Technology Licensing, LLC. His work at Microsoft has allowed him to leverage his expertise in technology and innovation. He has been instrumental in developing solutions that enhance process reliability and efficiency.

Collaborations

Ron has collaborated with talented individuals such as Yifat Orlin and Alexander Sloutsky. These collaborations have contributed to the advancement of his projects and the successful implementation of innovative solutions.

Conclusion

Ron E Dar Ziv is a distinguished inventor whose work in root cause problem identification has made a significant impact in the technology sector. His contributions continue to influence the way process failures are analyzed and resolved.

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