Wittenberg, Germany

Roman Calow

This inventor holds 1 USPTO granted patent. Top assignee: Inb Vision Ag. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Roman Calow. Retrieved from https://idiyas.com/inventor/roman-calow

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: The Innovations of Roman Calow

Introduction

Roman Calow is an accomplished inventor based in Wittenberg, Germany. He has made significant contributions to the field of measurement technology, particularly with his innovative approach to three-dimensional measurements of object surfaces. His work has garnered attention for its practical applications in various industries.

Latest Patents

Roman Calow holds a patent for a "Method of taking three-dimensional measurements of object surfaces." This invention showcases his expertise in developing advanced measurement techniques that enhance accuracy and efficiency in capturing object dimensions.

Career Highlights

Calow is currently employed at Inb Vision AG, a company known for its cutting-edge technology solutions. His role at the company allows him to apply his inventive skills to real-world challenges, contributing to the advancement of measurement technologies.

Collaborations

Throughout his career, Roman has collaborated with talented individuals such as Peter Albrecht and Igor Magziarek. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Roman Calow's contributions to the field of measurement technology exemplify the impact of innovative thinking in solving complex problems. His patent and work at Inb Vision AG highlight his commitment to advancing technology for practical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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