Montoire, France

Romain Granger

This inventor holds 2 USPTO granted patents. Top assignee: Hexagon Metrology Gmbh. Active years: 2009-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Romain Granger. Retrieved from https://idiyas.com/inventor/romain-granger-mkxcn3eg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 169(Granted Patents)


Company Filing History:


Years Active: 2009-2010

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2 patents (USPTO):Explore Patents

Title: Romain Granger: Innovator in Portable Measurement Technology

Introduction

Romain Granger is a notable inventor based in Montoire, France. He has made significant contributions to the field of measurement technology, particularly with his innovative designs. With a total of 2 patents to his name, Granger continues to push the boundaries of what is possible in his industry.

Latest Patents

Among his latest inventions is the Portable Coordinate Measurement Machine. This device exemplifies his commitment to enhancing precision and efficiency in measurement processes. Granger's work in this area has garnered attention for its practical applications in various industries.

Career Highlights

Romain Granger is currently employed at Hexagon Metrology GmbH, a company renowned for its advanced measurement solutions. His role there allows him to collaborate with other talented professionals and contribute to cutting-edge projects. Granger's expertise in measurement technology has positioned him as a valuable asset to his team.

Collaborations

Some of his notable coworkers include Jerry Gerent and Dongmei Hong. Their collective efforts in the field of measurement technology have led to innovative solutions that benefit various sectors.

Conclusion

Romain Granger's contributions to portable measurement technology highlight his innovative spirit and dedication to advancing the field. His work continues to inspire others in the industry, and his patents reflect his commitment to excellence.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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